منابع مشابه
Detecting resistive shorts for CMOS domino circuits
We investigate defects in CMOS domino gates and derive the test conditions for them. Very-Low-Voltage Testing can improve the defect coverage, which we define as the maximum detectable resistance, of intra-gate and inter-gate resistive shorts. We also propose a new keeper design for CMOS domino circuits. The new keeper design has low performance impact and is best useful for small CMOS domino g...
متن کاملBiomechanical Comparison of Shorts With Different Pads
An intensive use of the bicycle may increase the risk of erectile dysfunction and the compression of the perineal area has been showed to be a major mechanism leading to sexual alterations compromising the quality of life. Manufacturers claim that pads contribute to increase cyclists perineal protection ensuring a high level of comfort. To investigate the influence of various cycling pads with ...
متن کاملElimination of Undetectable Shorts during Channel Routing
abstract In this paper we present a procedure for reducing the probability of undetectable shorts occurring in routing channels. This procedure is implemented by modifying a channel router to predict many of the shorts that are undetectable and place the associated signal wires in non-adjacent tracks. For the designs we routed, we found that the probability of an undetectable non-feedback short...
متن کاملTesting CMOS Logic Gates for Realistic Shorts
It is assumed that tests generated using the single stuck-at fault model will implicitly detect the vast majority of fault-causing defects within logic elements. This may not be the case. In this paper we characterize the possible shorts in the combinational cells in a standard cell library. The characterization includes errors on the cell outputs, errors on the cell inputs, and excessive quies...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Passage - Tidsskrift for litteratur og kritik
سال: 1997
ISSN: 1904-7797,0901-8883
DOI: 10.7146/pas.v12i25.3762